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Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
October 9, 2020
Methodology for evaluating the information distribution in small angle scattering from periodic nanostructures
Daniel F Sunday, R Joseph Kline
Advanced Materials (Deerfield Beach, Fla.)
|
July 8, 2010
Microstructural characterization and charge transport in thin films of conjugated polymers
Alberto Salleo, R Joseph Kline, Dean M DeLongchamp, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithms
Adam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Applied Crystallography
|
April 7, 2017
NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
Andrew J Allen, Fan Zhang, R Joseph Kline, et al.
Journal of the American Chemical Society
|
February 24, 2007
X-ray scattering study of thin films of poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene)
Michael L Chabinyc, Michael F Toney, R Joseph Kline, et al.
The Journal of Physical Chemistry Letters
|
August 18, 2015
Local Orientational Structure of a P3HT π-π Conjugated Network Investigated by X-ray Nanodiffraction
Christian Gutt, Linda Grodd, Eduard Mikayelyan, et al.
ACS Applied Materials & Interfaces
|
June 2, 2015
Tuning Open-Circuit Voltage in Organic Solar Cells with Molecular Orientation
Brent Kitchen, Omar Awartani, R Joseph Kline, et al.
ACS Applied Materials & Interfaces
|
December 29, 2018
Impact of Substrate Characteristics on Stretchable Polymer Semiconductor Behavior
Tianlei Sun, Runqiao Song, Nrup Balar, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
September 3, 2010
Molecular characterization of organic electronic films
Dean M DeLongchamp, R Joseph Kline, Daniel A Fischer, et al.
Advanced Electronic Materials
|
July 11, 2017
Reversible Plastic Deformation of Polymer Blends as a Means to Achieve Stretchable Organic Transistors
Tianlei Sun, Joshua I Scott, Ming Wang, et al.
Page
of 5
Search research articles
Search
Showing results (1-10 of 42) with videos related to
Sort By:
Page
of 5
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
October 9, 2020
Methodology for evaluating the information distribution in small angle scattering from periodic nanostructures
Daniel F Sunday, R Joseph Kline
Advanced Materials (Deerfield Beach, Fla.)
|
July 8, 2010
Microstructural characterization and charge transport in thin films of conjugated polymers
Alberto Salleo, R Joseph Kline, Dean M DeLongchamp, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithms
Adam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Applied Crystallography
|
April 7, 2017
NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
Andrew J Allen, Fan Zhang, R Joseph Kline, et al.
Journal of the American Chemical Society
|
February 24, 2007
X-ray scattering study of thin films of poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene)
Michael L Chabinyc, Michael F Toney, R Joseph Kline, et al.
The Journal of Physical Chemistry Letters
|
August 18, 2015
Local Orientational Structure of a P3HT π-π Conjugated Network Investigated by X-ray Nanodiffraction
Christian Gutt, Linda Grodd, Eduard Mikayelyan, et al.
ACS Applied Materials & Interfaces
|
June 2, 2015
Tuning Open-Circuit Voltage in Organic Solar Cells with Molecular Orientation
Brent Kitchen, Omar Awartani, R Joseph Kline, et al.
ACS Applied Materials & Interfaces
|
December 29, 2018
Impact of Substrate Characteristics on Stretchable Polymer Semiconductor Behavior
Tianlei Sun, Runqiao Song, Nrup Balar, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
September 3, 2010
Molecular characterization of organic electronic films
Dean M DeLongchamp, R Joseph Kline, Daniel A Fischer, et al.
Advanced Electronic Materials
|
July 11, 2017
Reversible Plastic Deformation of Polymer Blends as a Means to Achieve Stretchable Organic Transistors
Tianlei Sun, Joshua I Scott, Ming Wang, et al.
Page
of 5