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Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 14, 2019
A Copolymer With Lamellar Morphology
R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 12, 2019
Effect of Low Pressures on the Room Temperature Transitions of Polytetrafluoroethylene
G M Martin, R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
March 20, 2020
Crystallization of Random Copolymers
Isaac C Sanchez, R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
January 14, 2020
Inclusion of Perfluoromethyl Groups in the Crystals of Copolymers of Tetrafluoroethylene and Hexafluoropropylene
L H Bolz, R K Eby
International Journal of Biological Macromolecules
|
May 26, 1999
Investigation of the nanofibrillar morphology in silk fibers by small angle X-ray scattering and atomic force microscopy
L D Miller, S Putthanarat, R K Eby, et al.
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of 1
Search research articles
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Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 14, 2019
A Copolymer With Lamellar Morphology
R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 12, 2019
Effect of Low Pressures on the Room Temperature Transitions of Polytetrafluoroethylene
G M Martin, R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
March 20, 2020
Crystallization of Random Copolymers
Isaac C Sanchez, R K Eby
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
January 14, 2020
Inclusion of Perfluoromethyl Groups in the Crystals of Copolymers of Tetrafluoroethylene and Hexafluoropropylene
L H Bolz, R K Eby
International Journal of Biological Macromolecules
|
May 26, 1999
Investigation of the nanofibrillar morphology in silk fibers by small angle X-ray scattering and atomic force microscopy
L D Miller, S Putthanarat, R K Eby, et al.
Page
of 1