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R P Goehner

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Journal of Research of the National Institute of Standards and Technology|January 1, 1996

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi PatternsR P Goehner, J R Michael

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Journal of Research of the National Institute of Standards and Technology|January 1, 1996

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi PatternsR P Goehner, J R Michael

Pageof 1