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Ultramicroscopy|September 28, 2011
Coherent Bremsstrahlung effect observed during STEM analysis of dopant distribution in silicon devices using large area silicon drift EDX detectors and high brightness electron sourceR Pantel
Micron (Oxford, England : 1993)|March 28, 2006
Dielectric and optical properties of nanometric nickel silicides from valence electrons energy-loss spectroscopy experimentsM C Cheynet, R Pantel
PET Clinics|November 21, 2020
Oncologic Applications of Long Axial Field-of-View PET/Computed TomographyLorenzo Nardo, Austin R Pantel
Cancer Letters|May 20, 2016
Molecular imaging to guide systemic cancer therapy: Illustrative examples of PET imaging cancer biomarkersAustin R Pantel, David A Mankoff
Ultramicroscopy|April 20, 2001
Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fittingD Delille, R Pantel, E Van Cappellen
Clinical Nuclear Medicine|July 22, 2022
Excreted 99m Tc-Pertechnetate in a Renal Pelvis as a Potential False Positive in a Meckel's ScanShannon M Lanzo, Austin R Pantel, Hongming Zhuang
IEEE Transactions on Radiation and Plasma Medical Sciences|November 2, 2020
Total Body PET: Why, How, What for?Suleman Surti, Austin R Pantel, Joel S Karp
Micron (Oxford, England : 1993)|March 15, 2006
Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si(1-x) Ge(x) nanostructuresR Pantel, M C Cheynet, F D Tichelaar
Ultramicroscopy|June 21, 2005
Chemical analysis of nanometric dielectric layers using spatially resolved VEELSS Pokrant, M Cheynet, S Jullian, et al.
Micron (Oxford, England : 1993)|May 6, 2009
Two-dimensional quantitative mapping of arsenic in nanometer-scale silicon devices using STEM EELS-EDX spectroscopyG Servanton, R Pantel, M Juhel, et al.
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