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Analytical Chemistry|April 11, 2017
Embedding-Free Method for Preparation of Cross-Sections of Organic Materials for Micro Chemical Analysis Using Gas Cluster Ion Beam SputteringIchiro Mihara, Rasmus Havelund, Ian S GilmoreJournal of the American Society for Mass Spectrometry|April 24, 2016
Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass SpectrometryMartin P Seah, Rasmus Havelund, Ian S GilmoreACS Nano|August 20, 2010
Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performanceTamer Uyar, Rasmus Havelund, Jale Hacaloglu, et al.Journal of the American Society for Mass Spectrometry|June 11, 2014
Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organicsRasmus Havelund, Martin P Seah, Alexander G Shard, et al.Nanotechnology|May 8, 2009
The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinningTamer Uyar, Rasmus Havelund, Jale Hacaloglu, et al.Analytical Chemistry|July 24, 2013
Argon cluster ion source evaluation on lipid standards and rat brain tissue samplesClaudia Bich, Rasmus Havelund, Rudolf Moellers, et al.ACS Applied Materials & Interfaces|January 7, 2015
3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profilingJames Bailey, Rasmus Havelund, Alexander G Shard, et al.ACS Applied Materials & Interfaces|January 4, 2019
Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass SpectrometryMariavitalia Tiddia, Ichiro Mihara, Martin P Seah, et al.Analytical Chemistry|October 18, 2017
Intracellular Drug Uptake-A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MSCarla F Newman, Rasmus Havelund, Melissa K Passarelli, et al.Analytical Chemistry|February 27, 2016
Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion SourcesYuta Yokoyama, Satoka Aoyagi, Makiko Fujii, et al.Pageof 2