Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ravikiran Attota

Showing results (1-10 of 7) with videos related to

Pageof 1
Sort By:
Journal of Biomedical Optics|July 8, 2018
Through-focus or volumetric type of optical imaging methods: a reviewRavikiran Attota
Optics Letters|February 13, 2016
Noise analysis for through-focus scanning optical microscopyRavikiran Attota
Optics Express|March 16, 2012
Optical microscope angular illumination analysisRavikiran Attota, Richard Silver
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Optimizing noise for defect analysis with through-focus scanning optical microscopyRavikiran Attota, John Kramar
Applied Optics|February 2, 2008
Linewidth measurement technique using through-focus optical imagesRavikiran Attota, Richard Silver, Ronald Dixson
Optics Letters|September 2, 2008
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysisRavikiran Attota, Thomas A Germer, Richard M Silver
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Journal of Biomedical Optics|July 8, 2018
Through-focus or volumetric type of optical imaging methods: a reviewRavikiran Attota
Optics Letters|February 13, 2016
Noise analysis for through-focus scanning optical microscopyRavikiran Attota
Optics Express|March 16, 2012
Optical microscope angular illumination analysisRavikiran Attota, Richard Silver
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Optimizing noise for defect analysis with through-focus scanning optical microscopyRavikiran Attota, John Kramar
Applied Optics|February 2, 2008
Linewidth measurement technique using through-focus optical imagesRavikiran Attota, Richard Silver, Ronald Dixson
Optics Letters|September 2, 2008
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysisRavikiran Attota, Thomas A Germer, Richard M Silver
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Pageof 1