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Raynald Gauvin

Showing results (31-40 of 79) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 28, 2020
Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid ModelYu Yuan, Hendrix Demers, Xianglong Wang, et al.
Ultramicroscopy|September 23, 2022
Line-rotated remapping for high-resolution electron backscatter diffractionYongzhe Wang, Nicolas Brodusch, Raynald Gauvin, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Ultramicroscopy|April 28, 2024
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)Nicolas Dumaresq, Nicolas Brodusch, Stéphanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2019
The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg-Al-Zn AlloysChaoyi Teng, Hendrix Demers, Xin Chu, et al.
Journal of Microscopy|August 6, 2025
Comparison of two Monte Carlo approaches for homogeneous bulk samplesDawei Gao, Yu Yuan, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2023
ZAFG Method for Quantitative Characterization of Spherical Particles: Deriving a Universal Equation for Geometrical CorrectionSeyed Mahmoud Bayazid, Nicolas Brodusch, Nicolas Dumaresq, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2015
Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation MappingDina Goldbaum, Richard R Chromik, Nicolas Brodusch, et al.
Ultramicroscopy|April 29, 2014
Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffractionMatthew Gallaugher, Nicolas Brodusch, Raynald Gauvin, et al.
Pageof 8

Showing results (31-40 of 79) with videos related to

Sort By:
Pageof 8
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 28, 2020
Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid ModelYu Yuan, Hendrix Demers, Xianglong Wang, et al.
Ultramicroscopy|September 23, 2022
Line-rotated remapping for high-resolution electron backscatter diffractionYongzhe Wang, Nicolas Brodusch, Raynald Gauvin, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Ultramicroscopy|April 28, 2024
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)Nicolas Dumaresq, Nicolas Brodusch, Stéphanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2019
The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg-Al-Zn AlloysChaoyi Teng, Hendrix Demers, Xin Chu, et al.
Journal of Microscopy|August 6, 2025
Comparison of two Monte Carlo approaches for homogeneous bulk samplesDawei Gao, Yu Yuan, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2023
ZAFG Method for Quantitative Characterization of Spherical Particles: Deriving a Universal Equation for Geometrical CorrectionSeyed Mahmoud Bayazid, Nicolas Brodusch, Nicolas Dumaresq, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2015
Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation MappingDina Goldbaum, Richard R Chromik, Nicolas Brodusch, et al.
Ultramicroscopy|April 29, 2014
Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffractionMatthew Gallaugher, Nicolas Brodusch, Raynald Gauvin, et al.
Pageof 8