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Richard Vanfleet

Showing results (1-10 of 6) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 27, 2013
Alternative FIB TEM sample preparation method for cross-sections of thin metal films deposited on polymer substratesFelipe Rivera, Robert Davis, Richard Vanfleet
Ultramicroscopy|January 23, 2023
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering modelsPaul S Minson, Felipe Rivera, Richard Vanfleet
Optics Express|October 13, 2022
Visible and short-wavelength infrared light collimation through carbon nanotube, parallel-hole collimatorsTyler Westover, Scott Olsen, Zach Westhoff, et al.
The Review of Scientific Instruments|April 4, 2023
Determining local modulus and strength of heterogeneous films by force-deflection mapping of microcantileversKyle Larsen, Stefan Lehnardt, Bryce Anderson, et al.
Journal of Chromatography. A|August 29, 2012
Stable, microfabricated thin layer chromatography plates without volume distortion on patterned, carbon and Al₂O₃-primed carbon nanotube forestsDavid S Jensen, Supriya S Kanyal, Vipul Gupta, et al.
Analytical and Bioanalytical Chemistry|December 25, 2015
Multi-instrument characterization of five nanodiamond samples: a thorough example of nanomaterial characterizationBhupinder Singh, Stacey J Smith, David S Jensen, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 27, 2013
Alternative FIB TEM sample preparation method for cross-sections of thin metal films deposited on polymer substratesFelipe Rivera, Robert Davis, Richard Vanfleet
Ultramicroscopy|January 23, 2023
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering modelsPaul S Minson, Felipe Rivera, Richard Vanfleet
Optics Express|October 13, 2022
Visible and short-wavelength infrared light collimation through carbon nanotube, parallel-hole collimatorsTyler Westover, Scott Olsen, Zach Westhoff, et al.
The Review of Scientific Instruments|April 4, 2023
Determining local modulus and strength of heterogeneous films by force-deflection mapping of microcantileversKyle Larsen, Stefan Lehnardt, Bryce Anderson, et al.
Journal of Chromatography. A|August 29, 2012
Stable, microfabricated thin layer chromatography plates without volume distortion on patterned, carbon and Al₂O₃-primed carbon nanotube forestsDavid S Jensen, Supriya S Kanyal, Vipul Gupta, et al.
Analytical and Bioanalytical Chemistry|December 25, 2015
Multi-instrument characterization of five nanodiamond samples: a thorough example of nanomaterial characterizationBhupinder Singh, Stacey J Smith, David S Jensen, et al.
Pageof 1