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Ultramicroscopy|April 23, 2013
Characterization of detector modulation-transfer function with noise, edge, and holographic methodsRobert A McLeod, Marek MalacUltramicroscopy|April 10, 2014
Phase measurement error in summation of electron holography seriesRobert A McLeod, Michael Bergen, Marek MalacUltramicroscopy|December 28, 2013
Determination of localized visibility in off-axis electron holographyRobert A McLeod, Martin Kupsta, Marek MalacMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 28, 2022
High-Energy Electron Scattering in <i>Thick</i> Samples Evaluated by Bright-Field Transmission Electron Microscopy, Energy-Filtering Transmission Electron Microscopy, and Electron TomographyMisa Hayashida, Marek MalacMicron (Oxford, England : 1993)|November 7, 2016
Practical electron tomography guide: Recent progress and future opportunitiesMisa Hayashida, Marek MalacMicron (Oxford, England : 1993)|November 22, 2023
Sample thickness affects contrast and measured shape in TEM images and in electron tomogramsMisa Hayashida, Jun Yamasaki, Marek MalacUltramicroscopy|July 7, 2009
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)Feng Wang, Ray Egerton, Marek MalacMicroscopy Research and Technique|February 22, 2018
Evaluation of electron tomography reconstruction methods for interface roughness measurementMisa Hayashida, Shinichi Ogawa, Marek MalacMicron (Oxford, England : 1993)|September 6, 2015
Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomographyMisa Hayashida, Kazuhiro Kumagai, Marek MalacUltramicroscopy|August 10, 2018
Wavelet transform-based electron tomography measurement of buried interface roughnessDarren Homeniuk, Marek Malac, Misa HayashidaPageof 6