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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 9, 2016
Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam MillingRobert Estivill, Guillaume Audoit, Jean-Paul Barnes, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|April 12, 2014
Effect of a side reaction involving structural changes of the surfactants on the shape control of cobalt nanoparticlesMiguel Comesaña-Hermo, Robert Estivill, Diana Ciuculescu, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
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