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Ronald J Warzoha

Showing results (1-10 of 8) with videos related to

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Physical Review Letters|April 8, 2022
Donovan and Warzoha ReplyBrian F Donovan, Ronald J Warzoha
The Review of Scientific Instruments|October 2, 2017
High resolution steady-state measurements of thermal contact resistance across thermal interface material junctionsRonald J Warzoha, Brian F Donovan
Physical Review Letters|March 7, 2020
Theoretical Paradigm for Thermal Rectification via Phonon Filtering and Spectral ConfinementBrian F Donovan, Ronald J Warzoha
ACS Applied Materials & Interfaces|July 2, 2014
Effect of graphene layer thickness and mechanical compliance on interfacial heat flow and thermal conduction in solid-liquid phase change materialsRonald J Warzoha, Amy S Fleischer
The Review of Scientific Instruments|September 1, 2022
Unwrapping a full temporal cycle in time domain thermoreflectance for enhanced measurement sensitivity in thermally insulating materialsBrian F Donovan, Taylor L Gray, Adam A Wilson, et al.
Small Methods|April 24, 2025
Directly Probing Thermal Transport Across Micrometer-Thick Metallic Interfaces Using Transient Thermal Grating SpectroscopyJinghang Dai, Samuel Kielar, Jiyoung Kim, et al.
ACS Applied Materials & Interfaces|July 24, 2024
Measurements of Thermal Resistance Across Buried Interfaces with Frequency-Domain Thermoreflectance and Microscale ConfinementRonald J Warzoha, Adam A Wilson, Brian F Donovan, et al.
ACS Photonics|November 24, 2025
Self-Referencing Photothermal Common-Path Interferometry to Measure Absorption of Si<sub>3</sub>N<sub>4</sub> Membranes for Laser-Light SailsTanuj Kumar, Demeng Feng, Shenwei Yin, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Physical Review Letters|April 8, 2022
Donovan and Warzoha ReplyBrian F Donovan, Ronald J Warzoha
The Review of Scientific Instruments|October 2, 2017
High resolution steady-state measurements of thermal contact resistance across thermal interface material junctionsRonald J Warzoha, Brian F Donovan
Physical Review Letters|March 7, 2020
Theoretical Paradigm for Thermal Rectification via Phonon Filtering and Spectral ConfinementBrian F Donovan, Ronald J Warzoha
ACS Applied Materials & Interfaces|July 2, 2014
Effect of graphene layer thickness and mechanical compliance on interfacial heat flow and thermal conduction in solid-liquid phase change materialsRonald J Warzoha, Amy S Fleischer
The Review of Scientific Instruments|September 1, 2022
Unwrapping a full temporal cycle in time domain thermoreflectance for enhanced measurement sensitivity in thermally insulating materialsBrian F Donovan, Taylor L Gray, Adam A Wilson, et al.
Small Methods|April 24, 2025
Directly Probing Thermal Transport Across Micrometer-Thick Metallic Interfaces Using Transient Thermal Grating SpectroscopyJinghang Dai, Samuel Kielar, Jiyoung Kim, et al.
ACS Applied Materials & Interfaces|July 24, 2024
Measurements of Thermal Resistance Across Buried Interfaces with Frequency-Domain Thermoreflectance and Microscale ConfinementRonald J Warzoha, Adam A Wilson, Brian F Donovan, et al.
ACS Photonics|November 24, 2025
Self-Referencing Photothermal Common-Path Interferometry to Measure Absorption of Si<sub>3</sub>N<sub>4</sub> Membranes for Laser-Light SailsTanuj Kumar, Demeng Feng, Shenwei Yin, et al.
Pageof 1