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Rubloff

Showing results (1-10 of 84) with videos related to

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Physical Review. B, Condensed Matter|April 15, 1986
Influence of thin SiO2 interlayers on chemical reaction and microstructure at the Ni/Si(111) interfaceLiehr, Lefakis, LeGoues, et al.
Physical Review Letters|June 1, 1987
Defect microchemistry at the SiO2/Si interfaceRubloff, Hofmann, Liehr, et al.
Physical Review. B, Condensed Matter|July 15, 1989
Microvoids at the SiO2/Si interfaceNielsen, Lynn, Welch, et al.
Applied Optics|January 15, 2010
A normal incidence scanning reflectometer of high precisionU Gerhardt, G W Rubloff
Physical Review Letters|November 18, 1985
High-temperature SiO2 decomposition at the SiO2/Si interfaceTromp, Rubloff, Balk, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 31, 2007
TMV microarrays: hybridization-based assembly of DNA-programmed viral nanotemplatesHyunmin Yi, Gary W Rubloff, James N Culver
Physical Review. B, Condensed Matter|September 15, 1991
SiO2/Si interface properties using positronsAsoka-Kumar, Lynn, Leung, et al.
Biomicrofluidics|December 6, 2016
Perspectives in flow-based microfluidic gradient generators for characterizing bacterial chemotaxisChristopher J Wolfram, Gary W Rubloff, Xiaolong Luo
The Analyst|January 11, 2012
Direct SERS detection of contaminants in a complex mixture: rapid, single step screening for melamine in liquid infant formulaJordan F Betz, Yi Cheng, Gary W Rubloff
ACS Nano|March 8, 2012
Nanoengineering strategies for metal-insulator-metal electrostatic nanocapacitorsLauren C Haspert, Sang Bok Lee, Gary W Rubloff
Pageof 9

Showing results (1-10 of 84) with videos related to

Sort By:
Pageof 9
Physical Review. B, Condensed Matter|April 15, 1986
Influence of thin SiO2 interlayers on chemical reaction and microstructure at the Ni/Si(111) interfaceLiehr, Lefakis, LeGoues, et al.
Physical Review Letters|June 1, 1987
Defect microchemistry at the SiO2/Si interfaceRubloff, Hofmann, Liehr, et al.
Physical Review. B, Condensed Matter|July 15, 1989
Microvoids at the SiO2/Si interfaceNielsen, Lynn, Welch, et al.
Applied Optics|January 15, 2010
A normal incidence scanning reflectometer of high precisionU Gerhardt, G W Rubloff
Physical Review Letters|November 18, 1985
High-temperature SiO2 decomposition at the SiO2/Si interfaceTromp, Rubloff, Balk, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 31, 2007
TMV microarrays: hybridization-based assembly of DNA-programmed viral nanotemplatesHyunmin Yi, Gary W Rubloff, James N Culver
Physical Review. B, Condensed Matter|September 15, 1991
SiO2/Si interface properties using positronsAsoka-Kumar, Lynn, Leung, et al.
Biomicrofluidics|December 6, 2016
Perspectives in flow-based microfluidic gradient generators for characterizing bacterial chemotaxisChristopher J Wolfram, Gary W Rubloff, Xiaolong Luo
The Analyst|January 11, 2012
Direct SERS detection of contaminants in a complex mixture: rapid, single step screening for melamine in liquid infant formulaJordan F Betz, Yi Cheng, Gary W Rubloff
ACS Nano|March 8, 2012
Nanoengineering strategies for metal-insulator-metal electrostatic nanocapacitorsLauren C Haspert, Sang Bok Lee, Gary W Rubloff
Pageof 9