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Related Concept Videos

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: Jun 17, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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A normal incidence scanning reflectometer of high precision.

U Gerhardt, G W Rubloff

    Applied Optics
    |January 15, 2010
    PubMed
    Summary

    A new reflectometer system precisely measures reflectance across photon energies. This advanced optical instrument reveals no fine structure in Germanium (Ge) reflectance below 2 eV.

    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Accurate measurement of material reflectance is crucial for understanding optical properties.
    • Existing reflectometer systems may have limitations in precision or continuous scanning capabilities.

    Purpose of the Study:

    • To describe a novel near-normal incidence reflectometer system for direct reflectance measurement.
    • To demonstrate the system's capability in characterizing material optical properties.

    Main Methods:

    • Utilized a near-normal incidence (~6 degrees) reflectometer with a rotating quartz light pipe (70 Hz).
    • Employed a gating circuit and photomultiplier to separate incident and reflected beams.
    • Implemented a servo system to stabilize the incident beam signal for direct reflectance recording.

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    Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
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    Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

    Published on: December 8, 2016

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    Published on: December 8, 2016

    Main Results:

    • The reflectometer system achieves high precision with absolute error of +/-2 x 10(-2) and relative error of +/-2 x 10(-5).
    • Successfully recorded reflectance R(omega) as a function of photon energy.
    • Examined the reflectance spectrum of Germanium (Ge) as a demonstration.

    Conclusions:

    • The developed reflectometer system offers accurate and continuous reflectance measurements.
    • No fine structure was detected in the reflectance spectrum of Germanium (Ge) below 2 eV, refining existing knowledge.