Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Runze Qi

Showing results (1-10 of 29) with videos related to

Pageof 3
Sort By:
Materials (Basel, Switzerland)|January 8, 2025
Evolution of Chemical, Structural, and Mechanical Properties of Titanium Nitride Films with Different Thicknesses Fabricated Using Pulsed DC Magnetron SputteringWei Mao, Runze Qi, Jiali Wu, et al.
Sensors (Basel, Switzerland)|September 14, 2024
A Study on the Motion Behavior of Metallic Contaminant Particles in Transformer Insulation Oil under Multiphysical FieldsBinbin Wei, Zhijuan Wang, Runze Qi, et al.
Journal of Nanoscience and Nanotechnology|October 18, 2018
Stress and Microstructure Study of W/Si X-ray Multilayers with Different Structural ParametersRunze Qi, Qiushi Huang, Yang Yang, et al.
Applied Optics|October 6, 2021
Simulation and measurement of systematic errors of stitching interferometry for high precision X-ray mirrors with large radius of curvatureQiaoyu Wu, Qiushi Huang, Jun Yu, et al.
Applied Optics|October 18, 2022
Cr/C multilayer growth on a heavy metal layer for upgrading of high efficiency tender x-ray gratingsYeqi Zhuang, Qiushi Huang, Wen Tan, et al.
Optics Express|May 14, 2021
Mo/Si lamellar multilayer gratings with high efficiency and enhanced resolution for the x-ray region of 1000-1700eVYufei Feng, Qiushi Huang, Yeqi Zhuang, et al.
Optics Express|July 14, 2016
Structure and stress studies of low temperature annealed W/Si multilayers for the X-ray telescopeQiushi Huang, Jinshuai Zhang, Runze Qi, et al.
Materials (Basel, Switzerland)|September 14, 2019
Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers ThicknessesRunze Qi, Qiushi Huang, Jiani Fei, et al.
Optics Letters|March 15, 2022
Cr/C lamellar multilayer grating in conical diffraction mounting for beam splitter used in X-ray free-electron lasersYufei Feng, LiangLiang Du, Qiushi Huang, et al.
Micromachines|March 29, 2023
Comparative Study on Microstructure of Mo/Si Multilayers Deposited on Large Curved Mirror with and without the Shadow MaskXiangyue Liu, Zhe Zhang, Hongxuan Song, et al.
Pageof 3

Showing results (1-10 of 29) with videos related to

Sort By:
Pageof 3
Materials (Basel, Switzerland)|January 8, 2025
Evolution of Chemical, Structural, and Mechanical Properties of Titanium Nitride Films with Different Thicknesses Fabricated Using Pulsed DC Magnetron SputteringWei Mao, Runze Qi, Jiali Wu, et al.
Sensors (Basel, Switzerland)|September 14, 2024
A Study on the Motion Behavior of Metallic Contaminant Particles in Transformer Insulation Oil under Multiphysical FieldsBinbin Wei, Zhijuan Wang, Runze Qi, et al.
Journal of Nanoscience and Nanotechnology|October 18, 2018
Stress and Microstructure Study of W/Si X-ray Multilayers with Different Structural ParametersRunze Qi, Qiushi Huang, Yang Yang, et al.
Applied Optics|October 6, 2021
Simulation and measurement of systematic errors of stitching interferometry for high precision X-ray mirrors with large radius of curvatureQiaoyu Wu, Qiushi Huang, Jun Yu, et al.
Applied Optics|October 18, 2022
Cr/C multilayer growth on a heavy metal layer for upgrading of high efficiency tender x-ray gratingsYeqi Zhuang, Qiushi Huang, Wen Tan, et al.
Optics Express|May 14, 2021
Mo/Si lamellar multilayer gratings with high efficiency and enhanced resolution for the x-ray region of 1000-1700eVYufei Feng, Qiushi Huang, Yeqi Zhuang, et al.
Optics Express|July 14, 2016
Structure and stress studies of low temperature annealed W/Si multilayers for the X-ray telescopeQiushi Huang, Jinshuai Zhang, Runze Qi, et al.
Materials (Basel, Switzerland)|September 14, 2019
Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers ThicknessesRunze Qi, Qiushi Huang, Jiani Fei, et al.
Optics Letters|March 15, 2022
Cr/C lamellar multilayer grating in conical diffraction mounting for beam splitter used in X-ray free-electron lasersYufei Feng, LiangLiang Du, Qiushi Huang, et al.
Micromachines|March 29, 2023
Comparative Study on Microstructure of Mo/Si Multilayers Deposited on Large Curved Mirror with and without the Shadow MaskXiangyue Liu, Zhe Zhang, Hongxuan Song, et al.
Pageof 3