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Ryan Miyakawa

Showing results (1-10 of 3) with videos related to

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Applied Optics|April 1, 2006
Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengthsKristine Rosfjord, Chang Chang, Ryan Miyakawa, et al.
Optics Express|October 17, 2014
Coded aperture detector: an image sensor with sub 20-nm pixel resolutionRyan Miyakawa, Rafael Mayer, Antoine Wojdyla, et al.
Optics Express|October 17, 2014
Electro-optical system for scanning microscopy of extreme ultraviolet masks with a high harmonic generation sourcePatrick P Naulleau, Christopher N Anderson, Erik H Anderson, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Optics|April 1, 2006
Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengthsKristine Rosfjord, Chang Chang, Ryan Miyakawa, et al.
Optics Express|October 17, 2014
Coded aperture detector: an image sensor with sub 20-nm pixel resolutionRyan Miyakawa, Rafael Mayer, Antoine Wojdyla, et al.
Optics Express|October 17, 2014
Electro-optical system for scanning microscopy of extreme ultraviolet masks with a high harmonic generation sourcePatrick P Naulleau, Christopher N Anderson, Erik H Anderson, et al.
Pageof 1