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Microscopy (Oxford, England)|July 22, 2025
Detection Limit of Defect-Induced Strain in GaN Evaluated by Valence EELS and Correlated Structural AnalysisShunsuke Yamashita, Jun Kikkawa, Susumu Kusanagi, et al.
The Journal of Physical Chemistry Letters|March 29, 2024
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum DotsYudai Yamaguchi, Yuta Inaba, Ryoji Arai, et al.
Optics Express|August 13, 2025
Electrically pumped laser oscillation of C-band InAs quantum dot vertical-cavity surface-emitting lasers on InP(311)B substrateMichinori Shiomi, Haruki Kishimoto, Tomomasa Watanabe, et al.
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