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Sébastien Jorez

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Applied Optics|September 6, 2002
Surface displacement imaging by interferometry with a light emitting diodeStefan Dilhaire, Stéphane Grauby, Sébastien Jorez, et al.
Applied Optics|April 10, 2003
Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging techniqueStéphane Grauby, Stefan Dilhaire, Sébastien Jorez, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Applied Optics|September 6, 2002
Surface displacement imaging by interferometry with a light emitting diodeStefan Dilhaire, Stéphane Grauby, Sébastien Jorez, et al.
Applied Optics|April 10, 2003
Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging techniqueStéphane Grauby, Stefan Dilhaire, Sébastien Jorez, et al.
Pageof 1