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Applied Optics
|
May 10, 1997
Correlation and image recognition with surface-scattered light
S Christie, F Kvasnik
Applied Optics
|
November 12, 2010
Contrast enhancement of underwater images with coherent optical image processors
S M Christie, F Kvasnik
Applied Optics
|
October 12, 2010
Wafer fault measurement by coherent optical processor
X Y Cai, F Kvasnik, R W Blore
Applied Optics
|
November 6, 2010
Fiducial markers for increasing the versatility of optical correlation in the measurement of faults on integrated-circuit wafers
X Y Cai, R W Blore, F Kvasnik
Applied Optics
|
January 15, 2010
An instrument for the geometric attributes of metallic appearance
J S Christie
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Applied Optics
|
May 10, 1997
Correlation and image recognition with surface-scattered light
S Christie, F Kvasnik
Applied Optics
|
November 12, 2010
Contrast enhancement of underwater images with coherent optical image processors
S M Christie, F Kvasnik
Applied Optics
|
October 12, 2010
Wafer fault measurement by coherent optical processor
X Y Cai, F Kvasnik, R W Blore
Applied Optics
|
November 6, 2010
Fiducial markers for increasing the versatility of optical correlation in the measurement of faults on integrated-circuit wafers
X Y Cai, R W Blore, F Kvasnik
Applied Optics
|
January 15, 2010
An instrument for the geometric attributes of metallic appearance
J S Christie
Page
of 1