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S D Findlay

Showing results (31-40 of 51) with videos related to

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Science (New York, N.Y.)|October 25, 2008
Direct imaging of reconstructed atoms on TiO2 (110) surfacesN Shibata, A Goto, S-Y Choi, et al.
Micron (Oxford, England : 1993)|July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrographL Clark, T C Petersen, T Williams, et al.
Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.
Ultramicroscopy|March 31, 2007
Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopyA J D'Alfonso, S D Findlay, M P Oxley, et al.
Ultramicroscopy|June 9, 2006
Spatial incoherence in phase retrieval based on focus variationA V Martin, F-R Chen, W-K Hsieh, et al.
Ultramicroscopy|July 22, 2008
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scatteringE C Cosgriff, A J D'Alfonso, L J Allen, et al.
Ultramicroscopy|July 12, 2011
Scanning transmission electron microscopy imaging dynamics at low accelerating voltagesN R Lugg, S D Findlay, N Shibata, et al.
Physical Review Letters|October 13, 2007
Two-dimensional mapping of chemical information at atomic resolutionM Bosman, V J Keast, J L García-Muñoz, et al.
Ultramicroscopy|July 11, 2017
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectorsH G Brown, N Shibata, H Sasaki, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron MicroscopyE W C Terzoudis-Lumsden, T C Petersen, H G Brown, et al.
Pageof 6

Showing results (31-40 of 51) with videos related to

Sort By:
Pageof 6
Science (New York, N.Y.)|October 25, 2008
Direct imaging of reconstructed atoms on TiO2 (110) surfacesN Shibata, A Goto, S-Y Choi, et al.
Micron (Oxford, England : 1993)|July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrographL Clark, T C Petersen, T Williams, et al.
Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.
Ultramicroscopy|March 31, 2007
Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopyA J D'Alfonso, S D Findlay, M P Oxley, et al.
Ultramicroscopy|June 9, 2006
Spatial incoherence in phase retrieval based on focus variationA V Martin, F-R Chen, W-K Hsieh, et al.
Ultramicroscopy|July 22, 2008
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scatteringE C Cosgriff, A J D'Alfonso, L J Allen, et al.
Ultramicroscopy|July 12, 2011
Scanning transmission electron microscopy imaging dynamics at low accelerating voltagesN R Lugg, S D Findlay, N Shibata, et al.
Physical Review Letters|October 13, 2007
Two-dimensional mapping of chemical information at atomic resolutionM Bosman, V J Keast, J L García-Muñoz, et al.
Ultramicroscopy|July 11, 2017
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectorsH G Brown, N Shibata, H Sasaki, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron MicroscopyE W C Terzoudis-Lumsden, T C Petersen, H G Brown, et al.
Pageof 6