Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

S Gurbán

Showing results (1-10 of 2) with videos related to

Pageof 1
Sort By:
Scientific Reports|April 30, 2021
Interface induced diffusionS Gurbán, A Sulyok, Miklos Menyhárd, et al.
Scientific Reports|February 3, 2018
Electron irradiation induced amorphous SiO<sub>2</sub> formation at metal oxide/Si interface at room temperature; electron beam writing on interfacesS Gurbán, P Petrik, M Serényi, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Scientific Reports|April 30, 2021
Interface induced diffusionS Gurbán, A Sulyok, Miklos Menyhárd, et al.
Scientific Reports|February 3, 2018
Electron irradiation induced amorphous SiO<sub>2</sub> formation at metal oxide/Si interface at room temperature; electron beam writing on interfacesS Gurbán, P Petrik, M Serényi, et al.
Pageof 1