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S Isakozawa

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Journal of Electron Microscopy|March 29, 2002
Spatially-resolved EELS analysis of multilayer using EFTEM and STEMK Kimoto, S Isakozawa, T Aoyama, et al.
Microscopy (Oxford, England)|May 15, 2013
An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopyR Nishi, Y Moriyama, K Yoshida, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Electron Microscopy|March 29, 2002
Spatially-resolved EELS analysis of multilayer using EFTEM and STEMK Kimoto, S Isakozawa, T Aoyama, et al.
Microscopy (Oxford, England)|May 15, 2013
An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopyR Nishi, Y Moriyama, K Yoshida, et al.
Pageof 1