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Ultramicroscopy|January 24, 2009
Failure mechanisms of silicon-based atom-probe tipsS Kölling, W VandervorstUltramicroscopy|April 13, 2013
Optimal laser positioning for laser-assisted atom probe tomographyS Koelling, N Innocenti, J Bogdanowicz, et al.Ultramicroscopy|January 15, 2011
Atom probe analysis of a 3D finFET with high-k metal gateM Gilbert, W Vandervorst, S Koelling, et al.DTW. Deutsche Tierarztliche Wochenschrift|June 1, 1994
[The therapy of postpartum secretion retention (lochiometra) in high-yielding cows]R Schiele, S Kölling, H J DieckhoffNanotechnology|August 7, 2015
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniquesP Eyben, P Bisiaux, A Schulze, et al.Journal of Microscopy|November 6, 2010
Characterization of nickel silicides using EELS-based methodsE Verleysen, H Bender, O Richard, et al.Ultramicroscopy|March 16, 2017
X-ray absorption in pillar shaped transmission electron microscopy specimensH Bender, F Seidel, P Favia, et al.Ultramicroscopy|December 2, 2015
Outwitting the series resistance in scanning spreading resistance microscopyA Schulze, R Cao, P Eyben, et al.Nanotechnology|July 9, 2009
Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verificationK Mylvaganam, L C Zhang, P Eyben, et al.Ultramicroscopy|February 4, 2011
Atom-probe for FinFET dopant characterizationA K Kambham, J Mody, M Gilbert, et al.Pageof 3