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S Mil'shtein
D C Joy

Scanning

Showing results (1-10 of 10) with videos related to

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Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Scanning|October 27, 2006
Infrared scanning for biomedical applicationsS Mil'Shtein
Scanning|June 21, 2002
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivityS Mil'shtein
Scanning|December 23, 2004
Scanning the pressure-induced distortion of fingerprintsS Mil'shtein, U Doshi
Scanning|December 22, 2006
Contactless optical scanning of fingerprints with 180 degrees viewJ Palma, C Liessner, S Mil'shtein
Scanning|August 21, 2003
Measurements of absolute x-ray generation efficiency for selected K, L, and M-linesM Satya Prasad, D C Joy
Scanning|September 14, 1999
A study of electron beam-induced conductivity in resistsJ J Hwu, D C Joy
Scanning|August 21, 2003
Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C Joy
Scanning|November 1, 1996
Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn
Scanning|September 26, 1997
Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscopeW P Wergin, R W Yaklich, S Roy, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Scanning|October 27, 2006
Infrared scanning for biomedical applicationsS Mil'Shtein
Scanning|June 21, 2002
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivityS Mil'shtein
Scanning|December 23, 2004
Scanning the pressure-induced distortion of fingerprintsS Mil'shtein, U Doshi
Scanning|December 22, 2006
Contactless optical scanning of fingerprints with 180 degrees viewJ Palma, C Liessner, S Mil'shtein
Scanning|August 21, 2003
Measurements of absolute x-ray generation efficiency for selected K, L, and M-linesM Satya Prasad, D C Joy
Scanning|September 14, 1999
A study of electron beam-induced conductivity in resistsJ J Hwu, D C Joy
Scanning|August 21, 2003
Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C Joy
Scanning|November 1, 1996
Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn
Scanning|September 26, 1997
Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscopeW P Wergin, R W Yaklich, S Roy, et al.
Pageof 1