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S O R Moheimani

Showing results (1-10 of 8) with videos related to

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The Review of Scientific Instruments|September 4, 2012
Resonant control of an atomic force microscope micro-cantilever for active Q controlM Fairbairn, S O R Moheimani
The Review of Scientific Instruments|June 8, 2013
Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt controlM Fairbairn, S O R Moheimani
The Review of Scientific Instruments|March 6, 2014
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopyK S Karvinen, S O R Moheimani
Ultramicroscopy|December 24, 2013
Control of the higher eigenmodes of a microcantilever: applications in atomic force microscopyK S Karvinen, S O R Moheimani
The Review of Scientific Instruments|September 8, 2011
Note: Piezoelectric strain voltage sensing at ultra-low frequenciesA Laskovski, S O R Moheimani, M R Yuce
Nanotechnology|August 14, 2010
High-speed cycloid-scan atomic force microscopyY K Yong, S O R Moheimani, I R Petersen
The Review of Scientific Instruments|March 8, 2013
Diagonal control design for atomic force microscope piezoelectric tube nanopositionersB Bhikkaji, Y K Yong, I A Mahmood, et al.
The Review of Scientific Instruments|January 3, 2013
Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issuesY K Yong, S O R Moheimani, B J Kenton, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|September 4, 2012
Resonant control of an atomic force microscope micro-cantilever for active Q controlM Fairbairn, S O R Moheimani
The Review of Scientific Instruments|June 8, 2013
Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt controlM Fairbairn, S O R Moheimani
The Review of Scientific Instruments|March 6, 2014
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopyK S Karvinen, S O R Moheimani
Ultramicroscopy|December 24, 2013
Control of the higher eigenmodes of a microcantilever: applications in atomic force microscopyK S Karvinen, S O R Moheimani
The Review of Scientific Instruments|September 8, 2011
Note: Piezoelectric strain voltage sensing at ultra-low frequenciesA Laskovski, S O R Moheimani, M R Yuce
Nanotechnology|August 14, 2010
High-speed cycloid-scan atomic force microscopyY K Yong, S O R Moheimani, I R Petersen
The Review of Scientific Instruments|March 8, 2013
Diagonal control design for atomic force microscope piezoelectric tube nanopositionersB Bhikkaji, Y K Yong, I A Mahmood, et al.
The Review of Scientific Instruments|January 3, 2013
Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issuesY K Yong, S O R Moheimani, B J Kenton, et al.
Pageof 1