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Journal of Research of the National Institute of Standards and Technology|February 8, 2024
Optical Characterization in Microelectronics ManufacturingS Perkowitz, D G Seiler, W M DuncanOptics Letters|August 21, 2009
Far-infrared optoacoustic material probing and imagingS Perkowitz, G BusseApplied Optics|August 21, 2010
Space-exposure effects on optical-baffle coatings at far-infrared wavelengthsM D Blue, S PerkowitzApplied Optics|June 18, 2010
Infrared properties of single crystal MgO, a substrate for high temperature superconducting filmsT R Yang, S Perkowitz, G L Carr, et al.Pageof 1