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S Rubanov

Showing results (1-10 of 12) with videos related to

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IEEE Transactions on Neural Networks|February 6, 2008
The layer-wise method and the backpropagation hybrid approach to learning a feedforward neural networkN S Rubanov
Micron (Oxford, England : 1993)|June 29, 2004
The application of FIB milling for specimen preparation from crystalline germaniumS Rubanov, P R Munroe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Damage in III-V compounds during focused ion beam millingS Rubanov, P R Munroe
Journal of Microscopy|May 26, 2004
FIB-induced damage in siliconS Rubanov, P R Munroe
Optics Express|March 4, 2011
Characterization of nanoscale features in tapered fractal and photonic crystal fibersC M Rollinson, S T Huntington, B C Gibson, et al.
The Review of Scientific Instruments|October 16, 2024
Influence of recrystallization on stability of tungsten scanning tunneling microscope tipsR Griffin, H J Chandler, S Rubanov, et al.
Nanoscale Advances|September 22, 2022
Creation of pure non-crystalline diamond nanostructures <i>via</i> room-temperature ion irradiation and subsequent thermal annealingF Picollo, A Battiato, F Bosia, et al.
Optics Express|June 6, 2009
Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM techniqueB Gibson, S Huntington, S Rubanov, et al.
Nanotechnology|October 22, 2009
Superconducting transition in Nb nanowires fabricated using focused ion beamG C Tettamanzi, C I Pakes, A Potenza, et al.
Nanotechnology|March 20, 2013
Controlled deterministic implantation by nanostencil lithography at the limit of ion-aperture stragglingA D C Alves, J Newnham, J A van Donkelaar, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
IEEE Transactions on Neural Networks|February 6, 2008
The layer-wise method and the backpropagation hybrid approach to learning a feedforward neural networkN S Rubanov
Micron (Oxford, England : 1993)|June 29, 2004
The application of FIB milling for specimen preparation from crystalline germaniumS Rubanov, P R Munroe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Damage in III-V compounds during focused ion beam millingS Rubanov, P R Munroe
Journal of Microscopy|May 26, 2004
FIB-induced damage in siliconS Rubanov, P R Munroe
Optics Express|March 4, 2011
Characterization of nanoscale features in tapered fractal and photonic crystal fibersC M Rollinson, S T Huntington, B C Gibson, et al.
The Review of Scientific Instruments|October 16, 2024
Influence of recrystallization on stability of tungsten scanning tunneling microscope tipsR Griffin, H J Chandler, S Rubanov, et al.
Nanoscale Advances|September 22, 2022
Creation of pure non-crystalline diamond nanostructures <i>via</i> room-temperature ion irradiation and subsequent thermal annealingF Picollo, A Battiato, F Bosia, et al.
Optics Express|June 6, 2009
Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM techniqueB Gibson, S Huntington, S Rubanov, et al.
Nanotechnology|October 22, 2009
Superconducting transition in Nb nanowires fabricated using focused ion beamG C Tettamanzi, C I Pakes, A Potenza, et al.
Nanotechnology|March 20, 2013
Controlled deterministic implantation by nanostencil lithography at the limit of ion-aperture stragglingA D C Alves, J Newnham, J A van Donkelaar, et al.
Pageof 2