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S Van Aert

Showing results (1-10 of 57) with videos related to

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Ultramicroscopy|September 29, 2004
Model based quantification of EELS spectraJ Verbeeck, S Van Aert
Ultramicroscopy|June 21, 2016
Progress and new advances in simulating electron microscopy datasets using MULTEMI Lobato, S Van Aert, J Verbeeck
Ultramicroscopy|July 18, 2006
Model-based quantification of EELS spectra: Including the fine structureJ Verbeeck, S Van Aert, G Bertoni
Ultramicroscopy|September 25, 2017
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurementM Alania, I Lobato, S Van Aert
Ultramicroscopy|June 6, 2023
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural networkI Lobato, A De Backer, S Van Aert
Ultramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van Aert
Ultramicroscopy|July 27, 2010
Linear versus non-linear structural information limit in high-resolution transmission electron microscopyS Van Aert, J H Chen, D Van Dyck
Ultramicroscopy|September 21, 2011
High precision measurements of atom column positions using model-based exit wave reconstructionA De Backer, S Van Aert, D Van Dyck
Ultramicroscopy|February 22, 2024
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determinationD G Şentürk, A De Backer, S Van Aert
Ultramicroscopy|April 17, 2019
The maximum a posteriori probability rule for atom column detection from HAADF STEM imagesJ Fatermans, S Van Aert, A J den Dekker
Pageof 6

Showing results (1-10 of 57) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|September 29, 2004
Model based quantification of EELS spectraJ Verbeeck, S Van Aert
Ultramicroscopy|June 21, 2016
Progress and new advances in simulating electron microscopy datasets using MULTEMI Lobato, S Van Aert, J Verbeeck
Ultramicroscopy|July 18, 2006
Model-based quantification of EELS spectra: Including the fine structureJ Verbeeck, S Van Aert, G Bertoni
Ultramicroscopy|September 25, 2017
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurementM Alania, I Lobato, S Van Aert
Ultramicroscopy|June 6, 2023
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural networkI Lobato, A De Backer, S Van Aert
Ultramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van Aert
Ultramicroscopy|July 27, 2010
Linear versus non-linear structural information limit in high-resolution transmission electron microscopyS Van Aert, J H Chen, D Van Dyck
Ultramicroscopy|September 21, 2011
High precision measurements of atom column positions using model-based exit wave reconstructionA De Backer, S Van Aert, D Van Dyck
Ultramicroscopy|February 22, 2024
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determinationD G Şentürk, A De Backer, S Van Aert
Ultramicroscopy|April 17, 2019
The maximum a posteriori probability rule for atom column detection from HAADF STEM imagesJ Fatermans, S Van Aert, A J den Dekker
Pageof 6