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Sangeetha Hari

Showing results (1-10 of 7) with videos related to

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Beilstein Journal of Nanotechnology|November 29, 2017
Electron beam induced deposition of silacyclohexane and dichlorosilacyclohexane: the role of dissociative ionization and dissociative electron attachment in the deposition processRagesh Kumar T P, Sangeetha Hari, Krishna K Damodaran, et al.
Micromachines|December 30, 2020
Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting MaterialSangeetha Hari, P H F Trompenaars, J J L Mulders, et al.
Beilstein Journal of Nanotechnology|May 7, 2024
Sidewall angle tuning in focused electron beam-induced processingSangeetha Hari, Willem F van Dorp, Johannes J L Mulders, et al.
Scientific Reports|November 23, 2022
Electron-beam patterned calibration structures for structured illumination microscopySangeetha Hari, Johan A Slotman, Yoram Vos, et al.
Small (Weinheim an Der Bergstrasse, Germany)|April 8, 2023
Modulation of Cathodoluminescence by Surface Plasmons in Silver NanowiresAmelia C Y Liu, Timothy J Davis, Toon Coenen, et al.
Nature Methods|June 15, 2021
Structured illumination microscopy with noise-controlled image reconstructionsCarlas S Smith, Johan A Slotman, Lothar Schermelleh, et al.
Beilstein Journal of Nanotechnology|December 1, 2018
Charged particle single nanometre manufacturingPhilip D Prewett, Cornelis W Hagen, Claudia Lenk, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Beilstein Journal of Nanotechnology|November 29, 2017
Electron beam induced deposition of silacyclohexane and dichlorosilacyclohexane: the role of dissociative ionization and dissociative electron attachment in the deposition processRagesh Kumar T P, Sangeetha Hari, Krishna K Damodaran, et al.
Micromachines|December 30, 2020
Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting MaterialSangeetha Hari, P H F Trompenaars, J J L Mulders, et al.
Beilstein Journal of Nanotechnology|May 7, 2024
Sidewall angle tuning in focused electron beam-induced processingSangeetha Hari, Willem F van Dorp, Johannes J L Mulders, et al.
Scientific Reports|November 23, 2022
Electron-beam patterned calibration structures for structured illumination microscopySangeetha Hari, Johan A Slotman, Yoram Vos, et al.
Small (Weinheim an Der Bergstrasse, Germany)|April 8, 2023
Modulation of Cathodoluminescence by Surface Plasmons in Silver NanowiresAmelia C Y Liu, Timothy J Davis, Toon Coenen, et al.
Nature Methods|June 15, 2021
Structured illumination microscopy with noise-controlled image reconstructionsCarlas S Smith, Johan A Slotman, Lothar Schermelleh, et al.
Beilstein Journal of Nanotechnology|December 1, 2018
Charged particle single nanometre manufacturingPhilip D Prewett, Cornelis W Hagen, Claudia Lenk, et al.
Pageof 1