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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National LaboratoryDouglas A Blom, Lawrence E Allard, Satoshi Mishina, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 2, 2010
The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of IllinoisJianguo Wen, James Mabon, Changhui Lei, et al.
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