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Sean B Andersson

Showing results (11-20 of 40) with videos related to

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Applied Physics Letters|July 5, 2013
High speed atomic force microscopy enabled by a sample profile estimatorPeng Huang, Sean B Andersson
Proceedings of the ... IEEE Conference on Decision & Control. IEEE Conference on Decision & Control|August 11, 2020
Simultaneous Localization and Parameter Estimation for Single Particle Tracking via Sigma Points based EMYe Lin, Sean B Andersson
The Review of Scientific Instruments|July 3, 2014
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithmPeng Huang, Sean B Andersson
Ultramicroscopy|November 10, 2018
A continuous sampling pattern design algorithm for atomic force microscopy imagesYufan Luo, Sean B Andersson
Ifac-Papersonline|March 10, 2022
Information Optimal Control for Single Particle Tracking MicroscopyNicholas A Vickers, Sean B Andersson
Proceedings of the ... American Control Conference. American Control Conference|August 11, 2020
Monte Carlo Simulation of Brownian Motion using a Piezo-Actuated Microscope StageNicholas A Vickers, Sean B Andersson
IEEE Transactions on Control Systems Technology : a Publication of the IEEE Control Systems Society|October 27, 2022
Synthetic Stochastic Motion Platform for Testing Single Particle Tracking MicroscopesNicholas A Vickers, Sean B Andersson
Proceedings of the ... IEEE Conference on Decision & Control. IEEE Conference on Decision & Control|June 2, 2022
Analysis of an Extremum Seeking Controller Under Bounded DisturbanceSamuel C Pinto, Sean B Andersson
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|December 15, 2015
Method for simultaneous localization and parameter estimation in particle tracking experimentsTrevor T Ashley, Sean B Andersson
Ifac-Papersonline|May 24, 2021
Feedforward Control for Single Particle Tracking Synthetic MotionNicholas A Vickers, Sean B Andersson
Pageof 4

Showing results (11-20 of 40) with videos related to

Sort By:
Pageof 4
Applied Physics Letters|July 5, 2013
High speed atomic force microscopy enabled by a sample profile estimatorPeng Huang, Sean B Andersson
Proceedings of the ... IEEE Conference on Decision & Control. IEEE Conference on Decision & Control|August 11, 2020
Simultaneous Localization and Parameter Estimation for Single Particle Tracking via Sigma Points based EMYe Lin, Sean B Andersson
The Review of Scientific Instruments|July 3, 2014
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithmPeng Huang, Sean B Andersson
Ultramicroscopy|November 10, 2018
A continuous sampling pattern design algorithm for atomic force microscopy imagesYufan Luo, Sean B Andersson
Ifac-Papersonline|March 10, 2022
Information Optimal Control for Single Particle Tracking MicroscopyNicholas A Vickers, Sean B Andersson
Proceedings of the ... American Control Conference. American Control Conference|August 11, 2020
Monte Carlo Simulation of Brownian Motion using a Piezo-Actuated Microscope StageNicholas A Vickers, Sean B Andersson
IEEE Transactions on Control Systems Technology : a Publication of the IEEE Control Systems Society|October 27, 2022
Synthetic Stochastic Motion Platform for Testing Single Particle Tracking MicroscopesNicholas A Vickers, Sean B Andersson
Proceedings of the ... IEEE Conference on Decision & Control. IEEE Conference on Decision & Control|June 2, 2022
Analysis of an Extremum Seeking Controller Under Bounded DisturbanceSamuel C Pinto, Sean B Andersson
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|December 15, 2015
Method for simultaneous localization and parameter estimation in particle tracking experimentsTrevor T Ashley, Sean B Andersson
Ifac-Papersonline|May 24, 2021
Feedforward Control for Single Particle Tracking Synthetic MotionNicholas A Vickers, Sean B Andersson
Pageof 4