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Sebastian Brück

Showing results (1-10 of 6) with videos related to

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Materials (Basel, Switzerland)|August 10, 2017
Investigation on the Residual Stress State of Drawn Tubes by Numerical Simulation and Neutron Diffraction AnalysisHeinz Palkowski, Sebastian Brück, Thilo Pirling, et al.
The Review of Scientific Instruments|December 3, 2008
An advanced magnetic reflectometerSebastian Brück, Steffen Bauknecht, Bernd Ludescher, et al.
Physical Review Letters|October 15, 2008
Uncompensated moments in the MnPd/Fe exchange bias systemSebastian Brück, Gisela Schütz, Eberhard Goering, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 30, 2013
Interface-induced modulation of charge and polarization in thin film Fe(3)O(4)He Tian, Jo Verbeeck, Sebastian Brück, et al.
Nature Materials|February 8, 2011
Orbital reflectometry of oxide heterostructuresEva Benckiser, Maurits W Haverkort, Sebastian Brück, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 9, 2014
Element specific monolayer depth profilingSebastian Macke, Abdullah Radi, Jorge E Hamann-Borrero, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|August 10, 2017
Investigation on the Residual Stress State of Drawn Tubes by Numerical Simulation and Neutron Diffraction AnalysisHeinz Palkowski, Sebastian Brück, Thilo Pirling, et al.
The Review of Scientific Instruments|December 3, 2008
An advanced magnetic reflectometerSebastian Brück, Steffen Bauknecht, Bernd Ludescher, et al.
Physical Review Letters|October 15, 2008
Uncompensated moments in the MnPd/Fe exchange bias systemSebastian Brück, Gisela Schütz, Eberhard Goering, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 30, 2013
Interface-induced modulation of charge and polarization in thin film Fe(3)O(4)He Tian, Jo Verbeeck, Sebastian Brück, et al.
Nature Materials|February 8, 2011
Orbital reflectometry of oxide heterostructuresEva Benckiser, Maurits W Haverkort, Sebastian Brück, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 9, 2014
Element specific monolayer depth profilingSebastian Macke, Abdullah Radi, Jorge E Hamann-Borrero, et al.
Pageof 1