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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

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An advanced magnetic reflectometer.

Sebastian Brück¹, Steffen Bauknecht, Bernd Ludescher

¹Max Planck Institute for Metals Research, Heisenbergstr. 3, D-70569 Stuttgart, Germany.

The Review of Scientific Instruments

|December 3, 2008

Summary

A new setup for soft-x-ray resonant magnetic reflectometry (soft-XRMR) enables detailed magnetic and chemical depth profiling of thin films. Initial tests on a NiCoO/Co bilayer demonstrate its potential for advanced materials research.

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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

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Published on: July 20, 2022

Area of Science:

Materials Science
Condensed Matter Physics
Spectroscopy

Background:

X-ray reflectometry (XRR) and x-ray magnetic circular dichroism (XMCD) are established techniques.
Characterizing magnetic and chemical depth profiles of thin films is crucial for materials science.
Existing setups may have limitations in magnetic field strength, temperature range, or sample manipulation.

Purpose of the Study:

To present a novel experimental setup for soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR).
To optimize the setup for a broad range of sample systems, focusing on high magnetic fields, low temperatures, and full rotational freedom within ultra-high vacuum (UHV).
To demonstrate the capabilities of the new setup through initial experimental results.

Main Methods:

Development of a new diffractometer integrating soft-x-ray magnetic absorption spectroscopy and soft-XRMR.
Implementation of high magnetic field capabilities, low-temperature environment, and unrestricted sample rotation.
Operation within an ultra-high vacuum (UHV) system for pristine sample analysis.
Application of soft-XRMR, combining XRR with XMCD, for depth-resolved chemical and magnetic information.

Main Results:

Successful construction and implementation of the advanced soft-XRMR experimental setup.
Demonstration of the setup's capability to perform magnetic and chemical depth profiling.
Acquisition of initial experimental data from a NiCoO/Co bilayer sample.

Conclusions:

The new experimental setup is highly versatile and capable of advanced soft-x-ray magnetic characterization.
The demonstrated results highlight the potential of soft-XRMR for in-depth analysis of layered thin-film magnetic materials.
This setup opens new avenues for investigating complex magnetic heterostructures.