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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Surface Science

Background:

  • Magnetic multilayers are crucial for functional devices.
  • Electric field control of magnetic properties offers performance enhancements.
  • Studying buried interfaces in these devices is experimentally challenging.

Purpose of the Study:

  • To investigate electric-field-induced effects on buried interfaces in magnetic multilayers.
  • To probe changes in the electronic structure of interfacial atoms using element-selective methods.
  • To understand the origin of electric-field control in magnetic devices.

Main Methods:

  • Utilized element-selective x-ray resonant magnetic reflectometry (XRRMR).
  • Applied electric fields to multilayer stacks with a Ni/SiO2 interface.
  • Analyzed shifts in the Ni L3-edge to probe electronic structure changes.

Main Results:

  • Observed an electric-field-induced shift in the Ni L3-edge energy.
  • This shift indicates a change in the oxidation state of interfacial Ni atoms.
  • Quantified that approximately 30% of the charge moved by the electric field affects interfacial Ni states.

Conclusions:

  • X-ray resonant magnetic reflectometry provides access to electric-field effects at buried interfaces.
  • Electric fields can alter the electronic and magnetic properties of interfacial atoms.
  • The study quantifies the electron redistribution contributing to electric-field control in magnetic multilayers.