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Nanotechnology|March 13, 2012
Open-loop band excitation Kelvin probe force microscopySenli Guo, Sergei V Kalinin, Stephen JesseSmall (Weinheim an Der Bergstrasse, Germany)|February 16, 2012
Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imagingSenli Guo, Santiago D Solares, Vadym Mochalin, et al.Nanotechnology|May 7, 2009
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopyStephen Jesse, Sergei V KalininNature Communications|March 14, 2015
Complete information acquisition in dynamic force microscopyAlexei Belianinov, Sergei V Kalinin, Stephen JesseIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|December 26, 2006
A decade of piezoresponse force microscopy: progress, challenges, and opportunitiesSergei V Kalinin, Andrei Rar, Stephen JesseNanotechnology|November 13, 2015
Dynamic behaviour in piezoresponse force microscopyStephen Jesse, Arthur P Baddorf, Sergei V KalininScience Advances|April 22, 2021
Exploring order parameters and dynamic processes in disordered systems via variational autoencodersSergei V Kalinin, Ondrej Dyck, Stephen Jesse, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 28, 2018
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular ScansXin Li, Ondrej Dyck, Sergei V Kalinin, et al.Nature Communications|December 3, 2016
Rapid mapping of polarization switching through complete information acquisitionSuhas Somnath, Alex Belianinov, Sergei V Kalinin, et al.Nano Letters|August 13, 2016
Phases and Interfaces from Real Space Atomically Resolved Data: Physics-Based Deep Data Image AnalysisRama K Vasudevan, Maxim Ziatdinov, Stephen Jesse, et al.Pageof 32