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Applied Microscopy
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March 8, 2022
Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy
Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, et al.
Small (Weinheim an Der Bergstrasse, Germany)
|
June 18, 2015
"Multipoint Force Feedback" Leveling of Massively Parallel Tip Arrays in Scanning Probe Lithography
Hanaul Noh, Goo-Eun Jung, Sukhyun Kim, et al.
Journal of Nanoscience and Nanotechnology
|
November 14, 2009
Fabrication of pseudo-crystal nanostructures of TiO2 particles under UV-irradiation
Young-Kwan Kim, Seong-Hun Yun, Myoung-Jae Lee, et al.
Journal of the American Chemical Society
|
September 21, 2012
Direct-write patterning of bacterial cells by dip-pen nanolithography
Jieun Kim, Young-Hun Shin, Seong-Hun Yun, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Applied Microscopy
|
March 8, 2022
Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy
Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, et al.
Small (Weinheim an Der Bergstrasse, Germany)
|
June 18, 2015
"Multipoint Force Feedback" Leveling of Massively Parallel Tip Arrays in Scanning Probe Lithography
Hanaul Noh, Goo-Eun Jung, Sukhyun Kim, et al.
Journal of Nanoscience and Nanotechnology
|
November 14, 2009
Fabrication of pseudo-crystal nanostructures of TiO2 particles under UV-irradiation
Young-Kwan Kim, Seong-Hun Yun, Myoung-Jae Lee, et al.
Journal of the American Chemical Society
|
September 21, 2012
Direct-write patterning of bacterial cells by dip-pen nanolithography
Jieun Kim, Young-Hun Shin, Seong-Hun Yun, et al.
Page
of 1