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Ultramicroscopy|February 6, 2009
Improve performance of scanning probe microscopy by balancing tuning fork prongsBoon Ping Ng, Ying Zhang, Shaw Wei Kok, et al.
Optics Express|October 14, 2010
Artifact removal by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopyZhaogang Dong, Ying Zhang, Shaw Wei Kok, et al.
Optics Express|April 15, 2010
Near-field ellipsometry for thin film characterizationZhuang Liu, Ying Zhang, Shaw Wei Kok, et al.
Ultramicroscopy|November 13, 2012
Reflection-based near-field ellipsometry for thin film characterizationZhuang Liu, Ying Zhang, Shaw Wei Kok, et al.
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