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Shigeo Okayama

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Journal of Electron Microscopy|August 27, 2005
Reference sample for the evaluation of SEM image resolution at a high magnification--nanometer-scale Au particles on an HOPG substrateShigeo Okayama, Satoshi Haraichi, Hirofumi Matsuhata
Journal of Electron Microscopy|January 21, 2010
Third-order spherical aberration correction using multistage self-aligned quadrupole correction-lens systemsKeiji Tamura, Shigeo Okayama, Ryuichi Shimizu
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Journal of Electron Microscopy|August 27, 2005
Reference sample for the evaluation of SEM image resolution at a high magnification--nanometer-scale Au particles on an HOPG substrateShigeo Okayama, Satoshi Haraichi, Hirofumi Matsuhata
Journal of Electron Microscopy|January 21, 2010
Third-order spherical aberration correction using multistage self-aligned quadrupole correction-lens systemsKeiji Tamura, Shigeo Okayama, Ryuichi Shimizu
Pageof 1