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Physical Review Letters|October 21, 2000
Structure and spectroscopy of surface defects from scanning force microscopy: theoretical predictionsKantorovich, Shluger, StonehamPhysical Review Letters|January 15, 2011
Mechanism of contrast formation in atomic force microscopy in waterMatthew Watkins, Alexander L ShlugerNanotechnology|June 11, 2009
Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscopeThomas Trevethan, Alexander ShlugerRSC Advances|May 6, 2022
The role of surface reduction in the formation of Ti interstitialsJulian Gaberle, Alexander ShlugerACS Applied Materials & Interfaces|February 13, 2025
Impact of Confined Water on the Electronic Structure of the SiO2 and WS2 InterfaceKatherine L Milton, Alexander ShlugerAdvanced Science (Weinheim, Baden-Wurttemberg, Germany)|December 26, 2023
On the Structure of Oxygen Deficient Amorphous Oxide FilmsJack Strand, Alexander L ShlugerNanoscale|October 16, 2018
Structure and properties of intrinsic and extrinsic defects in black phosphorusJulian Gaberle, Alexander L ShlugerJournal of Physics. Condensed Matter : an Institute of Physics Journal|October 17, 2019
Properties of intrinsic point defects and dimers in hexagonal boron nitrideJack Strand, Luca Larcher, Alexander L ShlugerJournal of Physics. Condensed Matter : an Institute of Physics Journal|June 7, 2017
Theoretical modeling of charge trapping in crystalline and amorphous Al2O3Oliver A Dicks, Alexander L ShlugerNature Materials|October 14, 2008
Electron-trapping polycrystalline materials with negative electron affinityKeith P McKenna, Alexander L ShlugerPageof 9