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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 22, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope.

Thomas Trevethan¹, Alexander Shluger

¹Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, UK.

|June 11, 2009

Summary

We demonstrate theoretical modeling for inducing single-electron transfer between surface defects using a scanning force microscope. This electron transfer can be controlled by tip electric fields or defect positioning.

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Last Updated: Jun 22, 2026

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Area of Science:

Surface science
Quantum mechanics
Scanning probe microscopy

Background:

Understanding electron transfer mechanisms is crucial for nanoscale electronics.
Defect engineering on insulating surfaces offers pathways for novel electronic properties.

Purpose of the Study:

To theoretically model the induction of single-electron transfer between surface defects.
To investigate the role of scanning force microscopy (SFM) in controlling electron transfer.

Main Methods:

Theoretical modeling of a realistic system: oxygen vacancy and noble metal adatom on MgO(001).
Analysis of electric field effects from an ionic tip apex.
Investigation of defect separation influence on electron transfer.

Main Results:

The electric field from an SFM tip significantly modifies defect ionization potentials and electron affinities.
Electron transfer from oxygen vacancy to metal adatom is achievable via field effect.
Electron transfer can also be induced by manipulating adatom position.

Conclusions:

Scanning force microscopy offers precise control over single-electron transfer between surface defects.
This work provides a theoretical framework for designing and manipulating electronic states at the nanoscale.