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Shuaipeng Yue

Showing results (1-10 of 7) with videos related to

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Applied Optics|October 18, 2022
Single-order focus multilayer Laue lensBin Ji, Shuaipeng Yue, Liang Zhou, et al.
Optics Express|December 23, 2022
Novel figuring method for a multilayer Laue lensBin Ji, Shuaipeng Yue, Liang Zhou, et al.
Optics Express|December 23, 2022
Refurbishment of W/B<sub>4</sub>C multilayers on Si substrate by etching a chromium buffer layerQingyan Hou, Ming Li, Rongli Cui, et al.
Applied Optics|June 10, 2024
Preparation and measurement of an x-ray Laue-type monochromator based on a WSi<sub>2</sub>/Si multilayerShuaipeng Yue, Qingyan Hou, Bin Ji, et al.
Optics Express|July 21, 2023
Preparation and testing of laterally graded multilayer with a double genetic algorithm and root mean square error optimization in differential depositionRuyu Yan, Ming Li, Qingyan Hou, et al.
The Review of Scientific Instruments|April 2, 2022
In situ transient Laue x-ray diffraction during high strain-rate tensionDongsheng Zhang, Can Yu, Ming Wang, et al.
Journal of Synchrotron Radiation|July 29, 2024
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurementsFang Liu, Ming Li, Qianshun Diao, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|October 18, 2022
Single-order focus multilayer Laue lensBin Ji, Shuaipeng Yue, Liang Zhou, et al.
Optics Express|December 23, 2022
Novel figuring method for a multilayer Laue lensBin Ji, Shuaipeng Yue, Liang Zhou, et al.
Optics Express|December 23, 2022
Refurbishment of W/B<sub>4</sub>C multilayers on Si substrate by etching a chromium buffer layerQingyan Hou, Ming Li, Rongli Cui, et al.
Applied Optics|June 10, 2024
Preparation and measurement of an x-ray Laue-type monochromator based on a WSi<sub>2</sub>/Si multilayerShuaipeng Yue, Qingyan Hou, Bin Ji, et al.
Optics Express|July 21, 2023
Preparation and testing of laterally graded multilayer with a double genetic algorithm and root mean square error optimization in differential depositionRuyu Yan, Ming Li, Qingyan Hou, et al.
The Review of Scientific Instruments|April 2, 2022
In situ transient Laue x-ray diffraction during high strain-rate tensionDongsheng Zhang, Can Yu, Ming Wang, et al.
Journal of Synchrotron Radiation|July 29, 2024
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurementsFang Liu, Ming Li, Qianshun Diao, et al.
Pageof 1