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Shuchun Huo

Showing results (1-10 of 8) with videos related to

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Applied Optics|November 18, 2014
Optimization for liquid crystal variable retarder-based spectroscopic polarization measurementsShuchun Huo, Chunguang Hu, Yanning Li, et al.
Applied Optics|November 22, 2016
Normal-incidence reflectance difference spectroscopy based on a liquid crystal variable retarderShuchun Huo, Chunguang Hu, Wanfu Shen, et al.
Optics Letters|March 16, 2018
Wavelength tunable polarizer based on layered black phosphorus on Si/SiO<sub>2</sub> substrateWanfu Shen, Chunguang Hu, Shuchun Huo, et al.
Optics Express|March 27, 2021
Measuring the multilayer silicon based microstructure using differential reflectance spectroscopyShuchun Huo, Hao Wang, Chunguang Hu, et al.
Optics Letters|August 1, 2020
Imaging layer thickness of large-area graphene using reference-aided optical differential reflection techniqueChunguang Hu, Hao Wang, Yongtao Shen, et al.
Nanomaterials (Basel, Switzerland)|February 1, 2019
Black Phosphorus Nano-Polarizer with High Extinction Ratio in Visible and Near-Infrared RegimeWanfu Shen, Chunguang Hu, Shuchun Huo, et al.
ACS Applied Materials & Interfaces|April 26, 2019
Evaporable Glass-State Molecule-Assisted Transfer of Clean and Intact Graphene onto Arbitrary SubstratesJingyi Qu, Bao-Wen Li, Yongtao Shen, et al.
Optics Express|July 2, 2026
Multi-mode interferometry for measuring the depth of deep silicon-etched microstructuresYunzhu Yue, Xingjian Jiang, Guannan Li, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Applied Optics|November 18, 2014
Optimization for liquid crystal variable retarder-based spectroscopic polarization measurementsShuchun Huo, Chunguang Hu, Yanning Li, et al.
Applied Optics|November 22, 2016
Normal-incidence reflectance difference spectroscopy based on a liquid crystal variable retarderShuchun Huo, Chunguang Hu, Wanfu Shen, et al.
Optics Letters|March 16, 2018
Wavelength tunable polarizer based on layered black phosphorus on Si/SiO<sub>2</sub> substrateWanfu Shen, Chunguang Hu, Shuchun Huo, et al.
Optics Express|March 27, 2021
Measuring the multilayer silicon based microstructure using differential reflectance spectroscopyShuchun Huo, Hao Wang, Chunguang Hu, et al.
Optics Letters|August 1, 2020
Imaging layer thickness of large-area graphene using reference-aided optical differential reflection techniqueChunguang Hu, Hao Wang, Yongtao Shen, et al.
Nanomaterials (Basel, Switzerland)|February 1, 2019
Black Phosphorus Nano-Polarizer with High Extinction Ratio in Visible and Near-Infrared RegimeWanfu Shen, Chunguang Hu, Shuchun Huo, et al.
ACS Applied Materials & Interfaces|April 26, 2019
Evaporable Glass-State Molecule-Assisted Transfer of Clean and Intact Graphene onto Arbitrary SubstratesJingyi Qu, Bao-Wen Li, Yongtao Shen, et al.
Optics Express|July 2, 2026
Multi-mode interferometry for measuring the depth of deep silicon-etched microstructuresYunzhu Yue, Xingjian Jiang, Guannan Li, et al.
Pageof 1