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Siddharth Rajupet

Showing results (1-10 of 6) with videos related to

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Langmuir : the ACS Journal of Surfaces and Colloids|November 3, 2021
DLVO Interactions between Particles and Rough Surfaces: An Extended Surface Element Integration MethodSiddharth Rajupet
Physical Review. E|April 17, 2021
Derjaguin-Landau-Verwey-Overbeek energy landscape of a Janus particle with a nonuniform capSiddharth Rajupet, Aidin Rashidi, Christopher L Wirth
Physical Review. E|August 16, 2020
Particle adhesion to rough surfacesSiddharth Rajupet, Mamadou Sow, Daniel J Lacks
ACS Applied Materials & Interfaces|April 29, 2025
PFSA-Ionomer Adsorption to C and Pt/C Particles in Fuel-Cell InksSiddharth Rajupet, Adam Z Weber, Clayton J Radke
Chemosphere|November 3, 2021
ab initio study of Mn-based systems for oxidative degradationColin Crago, Shifa Zhong, Siddharth Rajupet, et al.
Physical Review. E|May 19, 2021
Relative importance of electrostatic and van der Waals forces in particle adhesion to rough conducting surfacesSiddharth Rajupet, Adriaan A Riet, Qizan Chen, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Langmuir : the ACS Journal of Surfaces and Colloids|November 3, 2021
DLVO Interactions between Particles and Rough Surfaces: An Extended Surface Element Integration MethodSiddharth Rajupet
Physical Review. E|April 17, 2021
Derjaguin-Landau-Verwey-Overbeek energy landscape of a Janus particle with a nonuniform capSiddharth Rajupet, Aidin Rashidi, Christopher L Wirth
Physical Review. E|August 16, 2020
Particle adhesion to rough surfacesSiddharth Rajupet, Mamadou Sow, Daniel J Lacks
ACS Applied Materials & Interfaces|April 29, 2025
PFSA-Ionomer Adsorption to C and Pt/C Particles in Fuel-Cell InksSiddharth Rajupet, Adam Z Weber, Clayton J Radke
Chemosphere|November 3, 2021
ab initio study of Mn-based systems for oxidative degradationColin Crago, Shifa Zhong, Siddharth Rajupet, et al.
Physical Review. E|May 19, 2021
Relative importance of electrostatic and van der Waals forces in particle adhesion to rough conducting surfacesSiddharth Rajupet, Adriaan A Riet, Qizan Chen, et al.
Pageof 1