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Simon Hallais

Showing results (1-10 of 5) with videos related to

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Sensors (Basel, Switzerland)|July 11, 2023
PeakForce AFM Analysis Enhanced with Model Reduction TechniquesXuyang Chang, Simon Hallais, Kostas Danas, et al.
Scientific Reports|April 4, 2019
Aggregate-driven reconfigurations of carbon nanotubes in thin networks under strain: in-situ characterizationLaurence Bodelot, Luka Pavić, Simon Hallais, et al.
Scientific Reports|February 13, 2016
Three-dimensional full-field X-ray orientation microscopyNicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Ultramicroscopy|February 14, 2021
Principal image decomposition for multi-detector backscatter electron topography reconstructionJan Neggers, Eva Héripré, Marc Bonnet, et al.
Scientific Reports|May 18, 2021
Non-oxide precipitates in additively manufactured austenitic stainless steelManas Vijay Upadhyay, Meriem Ben Haj Slama, Steve Gaudez, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Sensors (Basel, Switzerland)|July 11, 2023
PeakForce AFM Analysis Enhanced with Model Reduction TechniquesXuyang Chang, Simon Hallais, Kostas Danas, et al.
Scientific Reports|April 4, 2019
Aggregate-driven reconfigurations of carbon nanotubes in thin networks under strain: in-situ characterizationLaurence Bodelot, Luka Pavić, Simon Hallais, et al.
Scientific Reports|February 13, 2016
Three-dimensional full-field X-ray orientation microscopyNicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Ultramicroscopy|February 14, 2021
Principal image decomposition for multi-detector backscatter electron topography reconstructionJan Neggers, Eva Héripré, Marc Bonnet, et al.
Scientific Reports|May 18, 2021
Non-oxide precipitates in additively manufactured austenitic stainless steelManas Vijay Upadhyay, Meriem Ben Haj Slama, Steve Gaudez, et al.
Pageof 1