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Simon Hettler

Showing results (11-20 of 35) with videos related to

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ACS Applied Materials & Interfaces|March 18, 2026
Transmission Electron Microscopy Analysis of the Microstructure of Nanocrystalline Small-Molecule Semiconductors in Functional Organic Thin-Film TransistorsSimon Hettler, Ute Zschieschang, Hagen Klauk, et al.
Micron (Oxford, England : 1993)|March 2, 2017
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applicationsSimon Hettler, Manuel Dries, Peter Hermann, et al.
Ultramicroscopy|August 12, 2020
Analyzing contrast in cryo-transmission electron microscopy: Comparison of electrostatic Zach phase plates and hole-free phase platesMartin Obermair, Simon Hettler, Chyongere Hsieh, et al.
RSC Advances|March 31, 2025
Structure and properties of tubular structures based on the quaternary misfit layered compound Sm<sub>1-</sub> Y <sub></sub> S-TaS<sub>2</sub>Simon Hettler, Mohammad Furqan, M B Sreedhara, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 13, 2012
Improving fabrication and application of Zach phase plates for phase-contrast transmission electron microscopySimon Hettler, Björn Gamm, Manuel Dries, et al.
Accounts of Chemical Research|November 4, 2024
Misfit Layered Compounds: Insights into Chemical, Kinetic, and Thermodynamic Stability of NanophasesAzat Khadiev, M B Sreedhara, Simon Hettler, et al.
Microscopy (Oxford, England)|November 15, 2020
Phase plates in the transmission electron microscope: operating principles and applicationsMarek Malac, Simon Hettler, Misa Hayashida, et al.
Micron (Oxford, England : 1993)|October 7, 2019
Phase masks for electron microscopy fabricated by thermal scanning probe lithographySimon Hettler, Lucas Radtke, Lukas Grünewald, et al.
Ultramicroscopy|April 17, 2015
On the role of inelastic scattering in phase-plate transmission electron microscopySimon Hettler, Jochen Wagner, Manuel Dries, et al.
Scanning|November 8, 2017
Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex StructureThomas Kowoll, Erich Müller, Susanne Fritsch-Decker, et al.
Pageof 4

Showing results (11-20 of 35) with videos related to

Sort By:
Pageof 4
ACS Applied Materials & Interfaces|March 18, 2026
Transmission Electron Microscopy Analysis of the Microstructure of Nanocrystalline Small-Molecule Semiconductors in Functional Organic Thin-Film TransistorsSimon Hettler, Ute Zschieschang, Hagen Klauk, et al.
Micron (Oxford, England : 1993)|March 2, 2017
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applicationsSimon Hettler, Manuel Dries, Peter Hermann, et al.
Ultramicroscopy|August 12, 2020
Analyzing contrast in cryo-transmission electron microscopy: Comparison of electrostatic Zach phase plates and hole-free phase platesMartin Obermair, Simon Hettler, Chyongere Hsieh, et al.
RSC Advances|March 31, 2025
Structure and properties of tubular structures based on the quaternary misfit layered compound Sm<sub>1-</sub> Y <sub></sub> S-TaS<sub>2</sub>Simon Hettler, Mohammad Furqan, M B Sreedhara, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 13, 2012
Improving fabrication and application of Zach phase plates for phase-contrast transmission electron microscopySimon Hettler, Björn Gamm, Manuel Dries, et al.
Accounts of Chemical Research|November 4, 2024
Misfit Layered Compounds: Insights into Chemical, Kinetic, and Thermodynamic Stability of NanophasesAzat Khadiev, M B Sreedhara, Simon Hettler, et al.
Microscopy (Oxford, England)|November 15, 2020
Phase plates in the transmission electron microscope: operating principles and applicationsMarek Malac, Simon Hettler, Misa Hayashida, et al.
Micron (Oxford, England : 1993)|October 7, 2019
Phase masks for electron microscopy fabricated by thermal scanning probe lithographySimon Hettler, Lucas Radtke, Lukas Grünewald, et al.
Ultramicroscopy|April 17, 2015
On the role of inelastic scattering in phase-plate transmission electron microscopySimon Hettler, Jochen Wagner, Manuel Dries, et al.
Scanning|November 8, 2017
Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex StructureThomas Kowoll, Erich Müller, Susanne Fritsch-Decker, et al.
Pageof 4