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Sin Yong Lee

Showing results (1-10 of 6) with videos related to

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Optics Express|September 10, 2020
Co-axial spectroscopic snap-shot ellipsometry for real-time thickness measurements with a small spot sizeSeung Woo Lee, Sin Yong Lee, Garam Choi, et al.
Applied Optics|August 5, 2020
Single-shot multispectral angle-resolved ellipsometryGaram Choi, Seung Woo Lee, Sin Yong Lee, et al.
Applied Optics|November 22, 2021
Single sequence phase shifting spectrally resolved interferometry for an in-line thin film thickness measurement using spectral reflectance and phaseYeongchan Cho, Seung Woo Lee, Sin Yong Lee, et al.
Applied Optics|October 6, 2021
Single-sequence stable spectroscopic reflectometry using simultaneous measurement of incident light and reflected lightSin Yong Lee, Seung Woo Lee, Garam Choi, et al.
Applied Optics|December 28, 2020
Coaxial spectroscopic imaging ellipsometry for volumetric thickness measurementSeung Woo Lee, Garam Choi, Sin Yong Lee, et al.
Applied Optics|October 8, 2021
Single-sequence stable spectroscopic reflectometry using simultaneous measurement of incident light and reflected light: publisher's noteSin Yong Lee, Seung Woo Lee, Garam Choi, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Optics Express|September 10, 2020
Co-axial spectroscopic snap-shot ellipsometry for real-time thickness measurements with a small spot sizeSeung Woo Lee, Sin Yong Lee, Garam Choi, et al.
Applied Optics|August 5, 2020
Single-shot multispectral angle-resolved ellipsometryGaram Choi, Seung Woo Lee, Sin Yong Lee, et al.
Applied Optics|November 22, 2021
Single sequence phase shifting spectrally resolved interferometry for an in-line thin film thickness measurement using spectral reflectance and phaseYeongchan Cho, Seung Woo Lee, Sin Yong Lee, et al.
Applied Optics|October 6, 2021
Single-sequence stable spectroscopic reflectometry using simultaneous measurement of incident light and reflected lightSin Yong Lee, Seung Woo Lee, Garam Choi, et al.
Applied Optics|December 28, 2020
Coaxial spectroscopic imaging ellipsometry for volumetric thickness measurementSeung Woo Lee, Garam Choi, Sin Yong Lee, et al.
Applied Optics|October 8, 2021
Single-sequence stable spectroscopic reflectometry using simultaneous measurement of incident light and reflected light: publisher's noteSin Yong Lee, Seung Woo Lee, Garam Choi, et al.
Pageof 1