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Journal of Nanoscience and Nanotechnology|May 16, 2009
Traceable nano geometric structure measurement and international comparisonSitian Gao, Hua Du, Minzhen Lu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 24, 2014
Spectral analysis of irregular roughness artifacts measured by atomic force microscopy and laser scanning microscopyYuhang Chen, Tingting Luo, Chengfu Ma, et al.
Ultramicroscopy|April 29, 2018
Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved couplingYushu Shi, Wei Li, Sitian Gao, et al.
Applied Biochemistry and Biotechnology|June 22, 2026
Efficient Pretreatment of Burdock Straw with Ternary Deep Eutectic Solvents under Mild Conditions Improves Saccharification EfficiencyDanping Zhang, Sitian Gao, Jun Zuo, et al.
Ultramicroscopy|September 25, 2020
Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrologyZhiyue Zheng, Sitian Gao, Wei Li, et al.
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