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Srinivasa M Salapaka

Showing results (1-10 of 7) with videos related to

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IEEE Transactions on Cybernetics|August 18, 2021
Parameterized MDPs and Reinforcement Learning Problems-A Maximum Entropy Principle-Based FrameworkAmber Srivastava, Srinivasa M Salapaka
Nanotechnology|May 7, 2009
Robust broadband nanopositioning: fundamental trade-offs, analysis, and design in a two-degree-of-freedom control frameworkChibum Lee, Srinivasa M Salapaka
The Review of Scientific Instruments|May 3, 2015
Model based control of dynamic atomic force microscopeChibum Lee, Srinivasa M Salapaka
The Review of Scientific Instruments|November 6, 2007
Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopyAjit C Shegaonkar, Srinivasa M Salapaka
The Review of Scientific Instruments|September 3, 2016
Robust atomic force microscopy using multiple sensorsMayank Baranwal, Ram S Gorugantu, Srinivasa M Salapaka
The Review of Scientific Instruments|September 3, 2015
Fast and robust control of nanopositioning systems: Performance limits enabled by field programmable analog arraysMayank Baranwal, Ram S Gorugantu, Srinivasa M Salapaka
IEEE Transactions on Neural Systems and Rehabilitation Engineering : a Publication of the IEEE Engineering in Medicine and Biology Society|June 10, 2010
Measuring robustness of the postural control system to a mild impulsive perturbationPilwon Hur, Brett A Duiser, Srinivasa M Salapaka, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Cybernetics|August 18, 2021
Parameterized MDPs and Reinforcement Learning Problems-A Maximum Entropy Principle-Based FrameworkAmber Srivastava, Srinivasa M Salapaka
Nanotechnology|May 7, 2009
Robust broadband nanopositioning: fundamental trade-offs, analysis, and design in a two-degree-of-freedom control frameworkChibum Lee, Srinivasa M Salapaka
The Review of Scientific Instruments|May 3, 2015
Model based control of dynamic atomic force microscopeChibum Lee, Srinivasa M Salapaka
The Review of Scientific Instruments|November 6, 2007
Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopyAjit C Shegaonkar, Srinivasa M Salapaka
The Review of Scientific Instruments|September 3, 2016
Robust atomic force microscopy using multiple sensorsMayank Baranwal, Ram S Gorugantu, Srinivasa M Salapaka
The Review of Scientific Instruments|September 3, 2015
Fast and robust control of nanopositioning systems: Performance limits enabled by field programmable analog arraysMayank Baranwal, Ram S Gorugantu, Srinivasa M Salapaka
IEEE Transactions on Neural Systems and Rehabilitation Engineering : a Publication of the IEEE Engineering in Medicine and Biology Society|June 10, 2010
Measuring robustness of the postural control system to a mild impulsive perturbationPilwon Hur, Brett A Duiser, Srinivasa M Salapaka, et al.
Pageof 1