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Stefan Krivec

Showing results (1-10 of 3) with videos related to

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Analytical Chemistry|February 15, 2017
Large O<sub>2</sub> Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO<sub>2</sub> FilmsSabine Holzer, Stefan Krivec, Sven Kayser, et al.
Analytical and Bioanalytical Chemistry|February 19, 2011
The effect of bias-temperature stress on Na+ incorporation into thin insulating filmsStefan Krivec, Michael Buchmayr, Thomas Detzel, et al.
Optics Express|April 15, 2010
Digital holographic reflectometryTristan Colomb, Stefan Krivec, Herbert Hutter, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Analytical Chemistry|February 15, 2017
Large O<sub>2</sub> Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO<sub>2</sub> FilmsSabine Holzer, Stefan Krivec, Sven Kayser, et al.
Analytical and Bioanalytical Chemistry|February 19, 2011
The effect of bias-temperature stress on Na+ incorporation into thin insulating filmsStefan Krivec, Michael Buchmayr, Thomas Detzel, et al.
Optics Express|April 15, 2010
Digital holographic reflectometryTristan Colomb, Stefan Krivec, Herbert Hutter, et al.
Pageof 1