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Stephan Uhlemann

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|December 16, 2014
Thermal magnetic field noise: electron optics and decoherenceStephan Uhlemann, Heiko Müller, Joachim Zach, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Advancing the hexapole Cs-corrector for the scanning transmission electron microscopeHeiko Müller, Stephan Uhlemann, Peter Hartel, et al.
Physical Review Letters|August 13, 2013
Thermal magnetic field noise limits resolution in transmission electron microscopyStephan Uhlemann, Heiko Müller, Peter Hartel, et al.
Ultramicroscopy|July 17, 2023
A novel ground-potential monochromator designFelix Börrnert, Stephan Uhlemann, Heiko Müller, et al.
Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.
Ultramicroscopy|December 17, 2021
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kVRyusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 16, 2014
Thermal magnetic field noise: electron optics and decoherenceStephan Uhlemann, Heiko Müller, Joachim Zach, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Advancing the hexapole Cs-corrector for the scanning transmission electron microscopeHeiko Müller, Stephan Uhlemann, Peter Hartel, et al.
Physical Review Letters|August 13, 2013
Thermal magnetic field noise limits resolution in transmission electron microscopyStephan Uhlemann, Heiko Müller, Peter Hartel, et al.
Ultramicroscopy|July 17, 2023
A novel ground-potential monochromator designFelix Börrnert, Stephan Uhlemann, Heiko Müller, et al.
Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.
Ultramicroscopy|December 17, 2021
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kVRyusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 1