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Stephen Jesse

Showing results (21-30 of 162) with videos related to

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ACS Nano|June 21, 2011
The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin filmsSergei V Kalinin, Stephen Jesse, Alexander Tselev, et al.
Ultramicroscopy|February 12, 2020
Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materialsOndrej Dyck, Stephen Jesse, Niklas Delby, et al.
Nanotechnology|September 15, 2020
Tracking atomic structure evolution during directed electron beam induced Si-atom motion in graphene via deep machine learningZiatdinov Maxim, Stephen Jesse, Bobby G Sumpter, et al.
Nanotechnology|May 8, 2009
Intermittent contact mode piezoresponse force microscopy in a liquid environmentBrian J Rodriguez, Stephen Jesse, Stefan Habelitz, et al.
Nature Chemistry|August 24, 2011
Measuring oxygen reduction/evolution reactions on the nanoscaleAmit Kumar, Francesco Ciucci, Anna N Morozovska, et al.
Faraday Discussions|April 22, 2017
Synergetic effects of K<sup>+</sup> and Mg<sup>2+</sup> ion intercalation on the electrochemical and actuation properties of the two-dimensional Ti<sub>3</sub>C<sub>2</sub> MXeneQiang Gao, Jeremy Come, Michael Naguib, et al.
Scientific Reports|September 5, 2019
Few-cycle Regime Atomic Force MicroscopyEnrique A López-Guerra, Suhas Somnath, Santiago D Solares, et al.
Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Scientific Reports|August 13, 2016
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real spaceLiam Collins, Alex Belianinov, Suhas Somnath, et al.
Nature Communications|July 21, 2015
Identification of phases, symmetries and defects through local crystallographyAlex Belianinov, Qian He, Mikhail Kravchenko, et al.
Pageof 17

Showing results (21-30 of 162) with videos related to

Sort By:
Pageof 17
ACS Nano|June 21, 2011
The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin filmsSergei V Kalinin, Stephen Jesse, Alexander Tselev, et al.
Ultramicroscopy|February 12, 2020
Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materialsOndrej Dyck, Stephen Jesse, Niklas Delby, et al.
Nanotechnology|September 15, 2020
Tracking atomic structure evolution during directed electron beam induced Si-atom motion in graphene via deep machine learningZiatdinov Maxim, Stephen Jesse, Bobby G Sumpter, et al.
Nanotechnology|May 8, 2009
Intermittent contact mode piezoresponse force microscopy in a liquid environmentBrian J Rodriguez, Stephen Jesse, Stefan Habelitz, et al.
Nature Chemistry|August 24, 2011
Measuring oxygen reduction/evolution reactions on the nanoscaleAmit Kumar, Francesco Ciucci, Anna N Morozovska, et al.
Faraday Discussions|April 22, 2017
Synergetic effects of K<sup>+</sup> and Mg<sup>2+</sup> ion intercalation on the electrochemical and actuation properties of the two-dimensional Ti<sub>3</sub>C<sub>2</sub> MXeneQiang Gao, Jeremy Come, Michael Naguib, et al.
Scientific Reports|September 5, 2019
Few-cycle Regime Atomic Force MicroscopyEnrique A López-Guerra, Suhas Somnath, Santiago D Solares, et al.
Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Scientific Reports|August 13, 2016
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real spaceLiam Collins, Alex Belianinov, Suhas Somnath, et al.
Nature Communications|July 21, 2015
Identification of phases, symmetries and defects through local crystallographyAlex Belianinov, Qian He, Mikhail Kravchenko, et al.
Pageof 17